EUROSOI Virtual Journal
Total articles: 1071
Listing 0 to 50
| Title |
Authors |
Publication |
YEAR/MONTH |
THEME |
| High voltage SOI SJ-LDMOS with dynamic back-gate voltage |
Wang WL, Zhang B, Chen WJ, Li ZJ |
ELECTRONICS LETTERS |
2009, 2 |
2 |
| High-frequency compact analytical noise model for double-gate metal-oxide-semiconductor field-effect transistor |
Lazaro A, Cerdeira A, Nae B, Estrada M, Iniguez B |
JOURNAL OF APPLIED PHYSICS |
2009, 2 |
2 |
| C-Band Optical 90 degrees-Hybrids Based on Silicon-on-Insulator 4 x 4 Waveguide Couplers |
Zimmermann L, Voigt K, Winzer G, Petermann K, Weinert CM |
IEEE PHOTONICS TECHNOLOGY LETTERS |
2009, 2 |
2 |
| Proposal for a Grating Waveguide Serving as Both a Polarization Splitter and an Efficient Coupler for Silicon-on-Insulator Nanophotonic Circuits |
Tang YB, Dai DX, He SL |
IEEE PHOTONICS TECHNOLOGY LETTERS |
2009, 2 |
2 |
| Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions |
Murray CE, Ren Z, Ying A, Polvino SM, Noyan IC, Cai Z |
APPLIED PHYSICS LETTERS |
2009, 2 |
2 |
| Gate-induced floating-body effect (GIFBE) in fully depleted triple-gate n-MOSFETs |
Na KI, Cristoloveanu S, Bae YH, Patruno P, Xiong W, Lee JH |
SOLID-STATE ELECTRONICS |
2009, 2 |
2 |
| Mobility and Effective Electric Field in Nonplanar Channel MOSFETs |
Jeong MK, Lee JH |
IEEE TRANSACTIONS ON NANOTECHNOLOGY |
2009, 1 |
2 |
| Dependence of memory margin of Cap-less memory cells on top Si thickness |
Choi KR, Lee CH, Kim SJ, Enomoto H, Shim TH, Cho WJ, Park JG |
APPLIED PHYSICS LETTERS |
2009, 1 |
2 |
| High-Q bulk-mode SOI square resonators with straight-beam anchors |
Khine L, Palaniapan M |
JOURNAL OF MICROMECHANICS AND MICROENGINEERING |
2009, 1 |
2 |
| Low-Cost and Highly Heat Controllable Capacitorless PiFET (Partially Insulated FET) 1T DRAM for Embedded Memory |
Bae DI, Kim S, Choi YK |
IEEE TRANSACTIONS ON NANOTECHNOLOGY |
2009, 1 |
2 |
| Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM |
Heidel DF, Marshall PW, Label KA, Schwank JR, Rodbell KP, Hakey MC, Berg MD, Dodd PE, Friendlich MR, Phan AD, Seidleck CM, Shaneyfelt MR, Xapsos MA |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
2008 , 12 |
2 |
| Harmonic distortion analysis of double gate graded-channel MOSFETs operating in saturation |
Doria RT, Cerdeira A, Raskin JP, Flandre D, Pavanello MA |
MICROELECTRONICS JOURNAL |
2008 , 12 |
2 |
| Silicon-on-Insulator-Based Radio Frequency Single-Electron Transistors Operating at Temperatures above 4.2 K |
Manoharan M, Tsuchiya Y, Oda S, Mizuta H |
NANO LETTERS |
2008 , 12 |
2 |
| Analog performance of standard and strained triple-gate silicon-on-insulator nFinFETs |
Pavanello MA, Martino JA, Simoen E, Rooyackers R, Collaert N, Claeys C |
SOLID-STATE ELECTRONICS |
2008 , 12 |
2 |
| Analysis of STI-induced mechanical stress-related Kink effect of 40 nm PD SOI NMOS devices biased in saturation region |
Lin IS, Su VC, Kuo JB, Chen D, Yeh CS, Tsai CT, Ma M |
SOLID-STATE ELECTRONICS |
2008 , 12 |
2 |
| Sensitivity of trigate MOSFETs to random dopant induced threshold voltage fluctuations |
Yan R, Lynch D, Cayron T, Lederer D, Afzalian A, Lee CW, Dehdashti N, Colinge JP |
SOLID-STATE ELECTRONICS |
2008 , 12 |
2 |
| Compact charge and capacitance modeling of undoped ultra-thin body (UTB) SOI MOSFETs |
Moldovan O, Chaves FA, Jimenez D, Iniguez B |
SOLID-STATE ELECTRONICS |
2008 , 12 |
2 |
| Fabrication and characterisation of high resistivity SOI substrates for monolithic high energy physics detectors |
Ruddell FH, Suder SL, Bain MF, Montgomery JH, Armstrong BM, Gamble HS, Denvir D, Casse G, Bowcock T, Allport PP, Marczewski J, Kucharski K, Tomaszewski D, Niemiec H, Kucewicz W |
SOLID-STATE ELECTRONICS |
2008 , 12 |
2 |
| Evaluation of super-critical thickness strained-Si on insulator (sc-SSOI) substrate |
Ogura A, Yoshida T, Kosemura D, Kakemura Y, Takei M, Saito H, Shimura T, Koganesawa T, Hirosawa I |
SOLID-STATE ELECTRONICS |
2008 , 12 |
2 |
| Realization of High Voltage (> 700 V) in New SOI Devices With a Compound Buried Layer |
Luo XR, Li ZJ, Zhang B, Fu DP, Zhan Z, Chen KF, Hu SD, Zhang ZY, Feng ZC, Yan B |
IEEE ELECTRON DEVICE LETTERS |
2008 , 12 |
2 |
| Characterization of the Back Interface in Strained-Silicon-on-Insulator Channel and Enhancement of Electrical Properties by Heat Treatment |
Jung MH, Kim KS, Cho WJ |
IEEE ELECTRON DEVICE LETTERS |
2008 , 12 |
2 |
| Analysis of Hybrid Dielectric Plasmonic Waveguides |
Salvador R, Martinez A, Garcia-Meca C, Ortuno R, Marti J |
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS |
2008 , 12 |
2 |
| Generation and Propagation of Single Event Transients in 0.18-mu m Fully Depleted SOI |
Gouker P, Brandt J, Wyatt P, Tyrrell B, Soares A, Knecht J, Keast C, McMorrow D, Narasimham B, Gadlage M, Bhuva B |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
2008 , 12 |
2 |
| Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on Thin-Film SOI Technology |
Bellini M, Phillips SD, Diestelhorst RM, Cheng P, Cressler JD, Marshall PW, Turowski M, Avenier G, Chantre A, Chevalier P |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
2008 , 12 |
2 |
| Gate-Length and Drain-Bias Dependence of Band-to-Band Tunneling-Induced Drain Leakage in Irradiated Fully Depleted SOI Devices |
Mamouni FE, Dixit SK, Schrimpf RD, Adell PC, Esqueda IS, McLain ML, Barnaby HJ, Cristoloveanu S, Xiong WZ |
IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
2008 , 12 |
2 |
| Comparisons of the Hot Carrier Effect in Quasi-Silicon-on-Insulator and Conventional Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistors Fabricated by Reversed Silicon Wafer Direct Bonding |
Matsumoto, Satoshi |
JAPANESE JOURNAL OF APPLIED PHYSICS |
2008 , 12 |
2 |
| Compact Modeling of Junction Current in Dynamically Depleted SOI MOSFETs |
Wu WM, Yao W, Gildenblat G, Scholten AJ |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
2008 , 11 |
2 |
| Growth of Carbon Nanotubes on Fully Processed Silicon-On-insulator CMOS Substrates |
Haque MS, Ali SZ, Guha PK, Oei SP, Park J, Maeng S, Teo KBK, Udrea F, Milne WI |
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY |
2008 , 11 |
2 |
| A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET |
Zhang G, Yoo WJ, Ling CH |
SOLID-STATE ELECTRONICS |
2008 , 11 |
2 |
| Temperature influence on the gate-induced floating body effect parameters in fully depleted SOI nMOSFETs |
Agopian PGD, Martino JA, Simoen E, Claeys C |
SOLID-STATE ELECTRONICS |
2008 , 11 |
2 |
| Low-Loss Polarization-Insensitive Silicon-on-Insulator-Based WDM Filter for Triplexer Applications |
Feng NN, Feng D, Liang H, Qian W, Kung CC, Fong J, Asghari M |
IEEE PHOTONICS TECHNOLOGY LETTERS |
2008 , 11 |
2 |
| Tunable Monolithic DWDM Band-Selection Interleaver Filter Switch on Silicon-on-Insulator Substrate |
Wu ZG, Honda S, Matsui J, Utaka K, Edura T, Tokuda M, Tsutsui K, Wada Y |
JOURNAL OF LIGHTWAVE TECHNOLOGY |
2008 , 10 |
2 |
| Static and dynamic electrical performances of STI thin-SOI power LDMOS transistors |
Cortes I, Fernandez-Martinez P, Flores D, Hidalgo S, Rebollo J |
SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2008, 9 |
2 |
| A new impact-ionization current model applicable to both bulk and SOI MOSFETs by considering self-lattice-heating |
Wei CQ, See GH, Zhou X, Chan L |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
2008, 9 |
2 |
| Strain reduction in selectively grown CdTe by MBE on nanopatterned silicon on insulator (SOI) substrates |
Bommena R, Seldrum T, Samain L, Sporken R, Sivananthan S, Brueck SRJ |
JOURNAL OF ELECTRONIC MATERIALS |
2008, 9 |
2 |
| Gain optimization in ion sensitive field-effect transistor based sensor with fully depleted silicon on insulator |
Shalev G, Doron A, Virobnik U, Cohen A, Sanhedrai Y, Levy |
APPLIED PHYSICS LETTERS |
2008, 8 |
2 |
| A simple analytical model for the front and back gate threshold voltages of a fully-depleted asymmetric SOI MOSFET |
Suh CH |
SOLID-STATE ELECTRONICS |
2008, 8 |
2 |
| Ultra-low power full adder circuit using SOI double-gate MOSFET devices |
Hassoune I, Yang X, O'Connor I, Navarro D |
ELECTRONICS LETTERS |
2008, 8 |
2 |
| Modelling of band-to-band tunnelling in silicon-on-insulator transistor with degenerately doped floating body |
Kim KR, Park BG, Dutton RW |
ELECTRONICS LETTERS |
2008, 8 |
2 |
| Scaling and optimization of MOS optical modulators in nanometer SOI waveguides |
Passaro VMN, Dell'Olio F |
IEEE TRANSACTIONS ON NANOTECHNOLOGY |
2008, 7 |
2 |
| New high-voltage (> 1200 V) MOSFET with the charge trenches on partial SOI |
Luo XR, Zhang B, Li ZJ |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
2008, 7 |
2 |
| Characterization of distribution of trap states in silicon-on-insulator layers by front-gate characteristics in n-channel SOI MOSFETs |
Kajiwara K, Nakajima Y, Hanajiri T, Toyabe T, Sugano T |
IEEE TRANSACTIONS ON ELECTRON DEVICES |
2008, 7 |
2 |
| Silicon-on-Nothing MOSFETs: An efficient solution for parasitic substrate coupling suppression in SOI devices |
Kilchytska V, Flandre D, Raskin JP |
APPLIED SURFACE SCIENCE |
2008, 7 |
2 |
| Multi-field simulations and characterization of CMOS-MEMS high-temperature smart gas sensors based on SOI technology |
Lu CC, Liao KH, Udrea F, Covington JA, Gardner JW |
JOURNAL OF MICROMECHANICS AND MICROENGINEERING |
2008, 7 |
2 |
| 6-T SRAM cell design with nanoscale double-gate SOI MOSFETs: impact of source/drain engineering and circuit topology |
Rashmi, Kranti A, Armstrong GA |
SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2008, 7 |
2 |
| Graded channel architecture: the solution for misaligned DG FD SOI n-MOSFETs |
Sharma RK, Gupta R, Gupta M, Gupta RS |
SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2008, 7 |
2 |
| RF and noise model of gate-all-around MOSFETs |
Lazaro A, Íñiguez B |
SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2008, 7 |
2 |
| A 2D simulation study and characterization of a novel vertical SOI MOSFET with a smart source/body tie |
Lin JT, Lee TY, Lin KC |
SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2008, 7 |
2 |
| A comparative study on analog/RF performance of UTB GOI and SOI devices |
Zhuge J, An X, Huang R, Xiao H, Hou XY, Wang RS, Wang YY |
SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2008, 7 |
2 |
| FinFET reliability study by forward gated-diode generation-recombination current |
Ma CY, Li B, Wei YQ, Zhang LM, He J, Zhang X, Lin XN, Chan MS |
SEMICONDUCTOR SCIENCE AND TECHNOLOGY |
2008, 7 |
2 |
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