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EUROSOI Landmark Publications

Title First Author Innovation keys Contact File
THRESHOLD VOLTAGE OF THIN-FILM SILICON-ON-INSULATOR (SOI) MOSFETS LIM HK --
WAFER BONDING FOR SILICON-ON-INSULATOR TECHNOLOGIES LASKY JB --
DOUBLE-GATE SILICON-ON-INSULATOR TRANSISTOR WITH VOLUME INVERSION - A NEW DEVICE WITH GREATLY ENHANCED PERFORMANCE BALESTRA F -- balestra@enserg.fr
Double-Gate Silicon-on-Insulator Transistor with Volume Inversion: a New Device with Greatly Enhanced Performance Francis Balestra -- balestra@enserg.fr
BONDING OF SILICON-WAFERS FOR SILICON-ON-INSULATOR MASZARA WP --
ADJUSTABLE CONFINEMENT OF THE ELECTRON GAS IN DUAL-GATE SILICON-ON-INSULATOR MOSFETs Sorin Cristoloveanu -- sorin@enserg.fr
SILICON-ON-INSULATOR "GATE- ALL-AROUND DEVICE" J.P. Colinge -- colinge@ece.ucdavis.edu
Hysteresis and critical phenomena in silicon on insulator MOSFETs Thierry Ouisse -- Thierry.Ouisse@enserg.fr
Oxygen-related activity and other specific electrical properties of SIMOX Sorin Cristoloveanu -- sorin@enserg.fr
Optimization of SIMOX for VLSI by Electrical Characterization Dimitris E. Ioannou -- dioannou@gmu.edu
Properties of Ultra-Thin Wafer-Bonded Silicon-on-Insulator MOSFETs Baquer Mazhari -- baquer@iitk.ac.in
SCALING THE SI MOSFET - FROM BULK TO SOI TO BULK YAN RH --
INFLUENCE OF SERIES RESISTANCES AND INTERFACE COUPLING ON THE TRANSCONDUCTANCE OF FULLY-DEPLETED SILICON-ON-INSULATOR MOSFETs Thierry Ouisse -- Thierry.Ouisse@enserg.fr
Point-Contact Pseudo-MOSFET for In-Situ Characterization of As-Grown Silicon-on-Insulator Wafers Sorin Cristoloveanu -- sorin@enserg.fr
Electrical Characterization of Silicon-On-Insulator Materials and Devices Sorin Cristoloveanu -- sorin@enserg.fr
SILICON-ON-INSULATOR MATERIAL TECHNOLOGY BRUEL M --
THE LOW-FREQUENCY NOISE BEHAVIOUR OF SILICON-ON-INSULATOR TECHNOLOGIES E. SIMOEN -- simoen@imec.be
CMOS scaling into the nanometer regime Taur Y --
Subband structure and anomalous valley splitting in ultra-thin silicon-on-insulator MOSFETs Thierry Ouisse -- Thierry.Ouisse@enserg.fr
ULTIMATE MOSFETs ON SOI: ULTRA THIN, SINGLE GATE, DOUBLE GATE, OR GROUND PLANE Sorin Cristoloveanu -- sorin@enserg.fr
FinFET - A self-aligned double-gate MOSFET scalable to 20 nm Hisamoto D --
A Review of the Pseudo-MOS Transistor in SOI Wafers: Operation, Parameter Extraction, and Applications Sorin Cristoloveanu -- sorin@enserg.fr
Device scaling limits of Si MOSFETs and their application dependencies Frank DJ --
Electron transport in silicon-on-insulator devices Francisco Gámiz -- fgamiz@ugr.es
Monte Carlo simulation of double-gate silicon-on-insulator inversion layers: The role of volume inversion Francisco Gámiz -- fgamiz@ugr.es
The Four-Gate Transistor Sorin Cristoloveanu -- sorin@enserg.fr
New Mechanism of Body Charging in Partially Depleted SOI-MOSFETs with Ultra-Thin Gate Oxides Jérémy Pretet -- jeremy.pretet@st.com
Monte Carlo simulation of electron mobility in silicon-on-insulator structures Francisco Gámiz -- fgamiz@ugr.es
Coulomb scattering model for ultrathin silicon-on-insulator inversion layers Francisco Gámiz -- fgamiz@ugr.es
Strained-Si?SiGe-on-insulator inversion layers: The role of strained-Si layer thickness on electron mobility Francisco Gámiz -- fgamiz@ugr.es
Revision of the Standard Hydrodynamic Transport Model for SOI Simulation Markus Gritsch -- gritsch@iue.tuwien.ac.at
Ultimately Thin Double-Gate SOI MOSFETs Thomas Ernst -- ThomasErnst@gmx.net
Frontiers of silicon-on-insulator G. K. Celler -- gceller@soitecusa.com
"Linear Kink Effect" Induced by Electron Valence Band Tunneling in Ultrathin Gate Oxide Bulk and SOI MOSFETs A. Mercha --
Electron mobility in double gate silicon on insulator transistors: Symmetric-gate versus asymmetric-gate configuration Francisco Gámiz -- fgamiz@ugr.es
A specific floating-body efect in fully depleted SOI MOSFETs with ultra-thin gate oxide M. Cassé --
Advanced SOI MOSFETs with buried alumina and ground plane: self-heating and short-channel efects K. Oshima --
New SOI lateral power devices with trench oxide J.M. Park --
Silicon-on-Nothing MOSFETs: Performance, Short-Channel Effects, and Backgate Coupling Jérémy Pretet -- jeremy.pretet@st.com
Electron mobility in ultrathin silicon-on-insulator layers at 4.2 K Mika Prunnila -- Mika.Prunnila@vtt.fi

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